Events
CALL FOR PAPERS - IISWC 2008
2008 Annual IEEE International Symposium on Workload Characterization
Sponsored by the IEEE Computer Society and the Technical Committee on
Computer Architecture
Seattle, WA
September 14-16, 2008
Important Dates
Abstracts Due: March 7, 2008
Paper Submission: March 14, 2008
Acceptance Notification: May 24, 2008
Call for Papers
This symposium is dedicated to the understanding and characterization
of workloads that run on all types of computing systems. New
CALL FOR PAPERS - IISWC 2008
2008 Annual IEEE International Symposium on Workload Characterization
Sponsored by the IEEE Computer Society and the Technical Committee on
Computer Architecture
Seattle, WA
September 14-16, 2008
Important Dates
Abstracts Due: March 7, 2008
Paper Submission: March 14, 2008
Acceptance Notification: May 24, 2008
Call for Papers
This symposium is dedicated to the understanding and characterization
of workloads that run on all types of computing systems. New
CALL FOR PAPERS - IISWC 2008
2008 Annual IEEE International Symposium on Workload Characterization
Sponsored by the IEEE Computer Society and the Technical Committee on
Computer Architecture
Seattle, WA
September 14-16, 2008
Important Dates
Abstracts Due: March 7, 2008
Paper Submission: March 14, 2008
Acceptance Notification: May 24, 2008
Call for Papers
This symposium is dedicated to the understanding and characterization
of workloads that run on all types of computing systems. New
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
